Determination of Multilayer Structure Parameters by Means of Reconstruction of Scattering Matrix from Known Reflection Coefficients

Abstract

A new method for determination of both layers’ permittivity and thickness of a plain multilayer structure is proposed. The reflection coefficient of a plain electromagnetic wave is considered as initial data in the problem. The method is based on an approach to reconstruction of the frequency dependences of all scattering matrix elements in a limited waveband. The scattering matrix has been recovered by recalculation of the measured reflection coefficients for this structure in free space and on a perfectly-conducting screen. A high accuracy in both permittivity and thickness determination is achieved due to identification of spectral coefficients which are distinguished from scattering matrix elements and expressed as a finite series of undamped complex exponents.